哪位高人能给翻译一下啊?The film thicknesses of the single layers were m
哪位高人能给翻译一下啊?
The film thicknesses of the single layers were measured with a
surface profiler. XRD (using 40 mA, 40 kV CuK α radiation) mea-surement with an out-of-plane arrangement was carried out
using symmetric (θ–θ ) and asymmetric (2 θ) scan modes to
evaluate the crystal structure. The incident angle of the X-rays
was set to 1° with respect to film surface under the asymmetric
scan mode. XRD with an in-plane arrangement was performed
using the symmetric (θχ–2θχ) scan mode to detect X-rays
diffracted from crystal lattice planes perpendicular to the sub-strate surface plane, where the incident angle of the X-rays was
also 1° with respect to the film surface. The surface morphology of
the thin films was observed as a topography using atomic force
microscopy (AFM) in a dynamic scan mode, where the surface
roughness (Ra) was determined from the topographies.